Advanced Instrumentation |
ELECTROCHEMICAL INSTRUMENTATION |
| |
| • |
several light-duty potentiostats for routine use |
| • |
high current potentiostat |
| • |
high frequency potentiostat (100,000 V/s) |
| • |
low current sensitivity (pA range) potentiostat |
| • |
electrochemical impedance system |
| • |
ethernet-based potentiostat system |
| • |
rotating disk electrode system |
| • |
coulometry system |
| • |
polarography system |
| • |
quartz crystal nanobalance system |
| • |
anodic stripping system |
| |
|
|
SPECTROSCOPY |
| |
| • |
Fourier transform infrared (FTIR) spectrometer |
| • |
FT-Surface Plasmon Resonance spectrometer |
| • |
Raman spectrometer |
| • |
Phase Modulation-FTIR (PM-FTIR) |
| • |
X-ray Photoelectron Spectrometer (XPS) |
| • |
Auger Electron Spectrometer (Scanning - SAM) |
| • |
Ion Scattering Spectrometer (ISS) |
| |
|
|
|
CHEMICAL ANALYSIS |
| |
| • |
Gas Chromatograph (GC) |
| • |
High Performance Liquid Chromatograph (HPLC) |
| • |
Liquid Chromatography - Mass Spectrometry (LC-MS) |
| • |
Gas Chromatography - Mass Spectrometry (GC-MS) |
| |
|
|
MICROSCOPY |
| |
| • |
Atomic Force Microscope (AFM) - 3 |
| • |
Scanning Tunneling Microscope (STM) - 2 |
| • |
Interference Microscope |
| • |
Surface Plasmon Resonance imaging system |
| • |
FT-IR microscope |
| • |
Raman imaging spectrometer |
| • |
Image enhanced ellipsometer |
| |
|
|
THERMOCHEMISTRY |
| |
| • |
high & low temperature solution calorimeters |
| • |
high temperature densimeters |
| • |
hydrothermal flow conductance |
| |
|
|
|
| |
|
| Additional instrumentation for forming thin films
by plasma deposition, sputter coating, spin coating and by spray
pyrolysis. |
| |
Copyright ©2020 University of Guelph, All Rights Reserved.
For Web and Content Issues: gszymans@uoguelph.ca,
tel. 519-824-4120 x53495